Description
Features:
1.manual or manual and automatic as a whole,precise positioning,convenient operating
2.Use the Imported gold-plated probe and anti-static material(torlon,PEI,PPS or PEEK)
3.Downward plate can adjust the force on IC automatically, ensure the force evenly;probe can be used for testing chips with residual balls or balls nonuniform
4.Mature design and precision machining,high-precision focusing,clear shaped
5.The special design for clasp reducing the friction,extending service life